Effects Degrading Accuracy of CPW mTRL Calibration at W Band
Phung G.N., Schmuckle F.J., Doerner R. , Heinrich W., Probst T., Arz U.Calibration, measurement accuracy, on-wafer measurement, probe
| Document type | Proceedings |
| Journal title / Source | 2018 IEEE/MTT-S International Microwave Symposium - IMS |
| Page numbers / Article number | 1296-1299 |
| Publisher's name | IEEE |
| Publisher's address (city only) | 445 Hoes Lane Piscataway NJ 08855-1331 United States |
| Publication date | 2018-6 |
| Conference name | 2018 IEEE/MTT-S International Microwave Symposium - IMS |
| Conference date | 10-06-2018 to 15-06-2018 |
| Conference place | Philadelphia |
| DOI | 10.1109/MWSYM.2018.8439837 |
| Web URL | https://www.fbh-berlin.com/publications-patents/publications/title/effects-degrading-accuracy-of-cpw-mtrl-calibration-at-w-band |
| Language | English |