Precision Measurements of Quantum Hall Resistance Plateau in Doping-Controlled Graphene Device
Chae D.H., Kim W.S., Satrapinski A., Novikov S.Graphene, quantum Hall effect, precision measurement, resistance metrology, cryogenic current comparator
| Document type | Proceedings |
| Journal title / Source | Digest on Conference on Precision Electromagnetic Measurements (CPEM2016) |
| Peer-reviewed article | 1 |
| Publisher's name | IEEE |
| Publication date | 2016-8-11 |
| Conference name | CPEM 2016 |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa, Canada |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540495 |
| ISBN | 978-1-4673-9134-4 |
| Web URL | http://ieeexplore.ieee.org/document/7540495/?denied |
| Language | English |