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Fast and automated verification of multi-channel full time-domain EMI measurement systems

Azpurua M.A., Oliva J.A., Pous M., Silva F.
Keywords:

electromagnetic compatibility, electromagnetic interference, just-before-test, quality management, standards

Document type Proceedings
Journal title / Source 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Page numbers / Article number 1-7
Publisher's name IEEE
Publication date 2017-7
Conference name 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Conference date 22-05-2017 to 25-05-2017
Conference place Turin, Italy
DOI 10.1109/I2MTC.2017.7969789
ISBN 978-1-5090-3596-0
Web URL https://upcommons.upc.edu/handle/2117/116687
Language English

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Information

Project title (JRP)
15RPT01: RFMicrowave: Development of RF and microwave metrology capability
Name of Call / Funding Programme
EMPIR 2015: Research Potential