The gateway to Europe's
integrated metrology community.

SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation

Pollinger F., Mildner J., Meyer T., Meiners-Hagen K.
Keywords:

Interferometry, Interferometers, Optical properties, Lasers, Optical, Long distance, refractivity-compensation, two-color, multi-wavelength interferometry

Document type Article
Journal title / Source Applied Physics Letters
Volume 111
Issue 19
Page numbers / Article number 191104
Publisher's name AIP Publishing
Publication date 2017-11
ISSN 0003-6951, 1077-3118
DOI 10.1063/1.5000569
Language English

Back to the list view

Information

Project title (JRP)
SIB60: Surveying: Metrology for long distance surveying
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)