SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation
Pollinger F., Mildner J., Meyer T., Meiners-Hagen K.Interferometry, Interferometers, Optical properties, Lasers, Optical, Long distance, refractivity-compensation, two-color, multi-wavelength interferometry
| Document type | Article |
| Journal title / Source | Applied Physics Letters |
| Volume | 111 |
| Issue | 19 |
| Page numbers / Article number | 191104 |
| Publisher's name | AIP Publishing |
| Publication date | 2017-11 |
| ISSN | 0003-6951, 1077-3118 |
| DOI | 10.1063/1.5000569 |
| Language | English |