ScanClouDT - a new project to improve traceability for industrial 3D digitalization by advanced scanning systems
Pollinger F., Mählich D., del Mar Pérez Hernández M., Jakub M., Mehdi-Souzani C., Mendikute A., Mutilba U., Nawotka M., Nouira H., Pandraud G., Pexman K., Prado J., Przyklenk A., Robson S., Sanfridson M., Šlesinger R., Ślusarski Ł., Spetz J., Łapiński S., Langer M., Lafon L., Anwer N., Arce Criado A., Asua B., Bergstrand S., Boehm J., Rubio Guivernau J., Hemming B., Heinzel S., Heißelmann D., Holst C., Hyyti H., Kallio U., Keller F., Köchert P., Koivula H., Korpelainen V., Kukko A., Wiśniewski M.Digital metrological twin (D-MT), point cloud quality, SI traceability, measurement uncertainty, virtual experiment, length metrology, JRP ScanClouDT, 3D laser scanning
| Document type | Proceedings |
| Journal title / Source | |
| Publisher's name | Zenodo |
| Publisher's address (city only) | Braunschweig |
| Publication date | 2025-1-1 |
| Conference name | The Fortieth Annual Meeting of The American Society for Precision Engineering |
| Conference date | 03-07 November 2025 |
| Conference place | San Diego, USA |
| DOI | 10.5281/zenodo.18185689 |