A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

Piquemal F., Kaja K., Chrétien P., Morán-Meza J., Houzé F., Ulysse C., Harouri A.

calibration conductive probe atomic force microscopy measurement protocol nanoscale resistance reference

Document type Article
Journal title / Source Beilstein Journal of Nanotechnology
Volume 14
Page numbers / Article number 1141-1148
Publisher's name Beilstein Institut
Publisher's address (city only) Frankfurt am Main, Germany
Publication date 2023-11-22
ISSN 2190-4286
DOI 10.3762/bjnano.14.94
Web URL https://www.beilstein-journals.org/bjnano/articles/14/94
Language English

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