A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
Piquemal F., Kaja K., Chrétien P., Morán-Meza J., Houzé F., Ulysse C., Harouri A.calibration conductive probe atomic force microscopy measurement protocol nanoscale resistance reference
| Document type | Article |
| Journal title / Source | Beilstein Journal of Nanotechnology |
| Volume | 14 |
| Page numbers / Article number | 1141-1148 |
| Publisher's name | Beilstein Institut |
| Publisher's address (city only) | Frankfurt am Main, Germany |
| Publication date | 2023-11-22 |
| ISSN | 2190-4286 |
| DOI | 10.3762/bjnano.14.94 |
| Web URL | https://www.beilstein-journals.org/bjnano/articles/14/94 |
| Language | English |