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Recommendations for the Design of Differential Thin-Film Microstrip Lines

Phung G.N, Arz U., Pham T.D, Allal D., Lahbacha K., Miele G., Maffucci A.
Keywords:

thin-film microstrip lines, parasitic effects, electromagnetic (EM) simulation

Document type Proceedings
Journal title / Source 2023 IEEE 27th Workshop on Signal and Power Integrity (SPI) proceedings
Publication date 2023-6-12
Conference name 2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)
Conference date 07-05-2023 to 10-05-2023
Conference place Aveiro, Portugal
DOI 10.5281/zenodo.10548539
Web URL https://ieeexplore.ieee.org/document/10145555
Language English

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Information

Name of Call / Funding Programme
EMPIR 2020: Industry