Transfer of mTRL Accuracy in industrial BiCMOS Technology to commercial Lumped-Element Calibrations up to 110 GHz
Phung G., Arz U., Dinh An S., Azevedo Goncalves J.BiCMOS technology, calibration, on-wafer measurements
| Document type | Proceedings |
| Journal title / Source | |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2026-1-1 |
| Conference name | 106th ARFTG Microwave Measurement Conference |
| Conference date | 18-21 January 2026 |
| Conference place | Los Angeles, CA, USA |
| ISSN | 2767-8776 |
| DOI | 10.5281/zenodo.19629031 |