On the Influence of Thru- and Line-Length-Related Effects in CPW- Based Multiline TRL Calibrations
Phung G.N., Arz U.calibration, coplanar waveguides, on-wafer, probes
| Document type | Proceedings |
| Journal title / Source | 2021 97th ARFTG Microwave Measurement Conference |
| Publisher's name | IEEE |
| Publication date | 2021-12-17 |
| Conference name | 2021 97th ARFTG Microwave Measurement Conference |
| Conference date | 25-06-2021 to 25-06-2021 |
| Conference place | Atlanta |
| ISBN | 978-1-6654-0328-3 |
| Web URL | https://oar.ptb.de/resources/show/10.7795/EMPIR.18SIB09.CA.20220915A https://oar.ptb.de/files/download/632b078b806c0000af003189 |
| Language | English |
| Persistent Identifier | 978-1-6654-0328-3 |