Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width
Phung G.N., Arz U.calibration, coplanar waveguides, multiline Thru-Reflect Line (mTRL), probes
| Document type | Proceedings |
| Journal title / Source | 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI) |
| Publisher's name | IEEE |
| Publication date | 2020-5 |
| Conference name | 2020 IEEE 24th Workshop on Signal and Power Integrity |
| Conference date | 17-05-2020 to 20-05-2020 |
| Conference place | Cologne |
| DOI | 10.1109/SPI48784.2020.9218166 |
| Web URL | https://oar.ptb.de/files/download/5f92a12a4c93902ba0000843 |
| Language | English |