Measurement-Based Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines
Pham T. D., Allal D., Chiariello A. G. , Maffucci G., Miele G., Di Capua G., Lahbacha K.Signal Integrity, Thin film, TFMSL, SU-8, Transmissions, Reflections, Eye-diagrams, Data rate
| Document type | Proceedings |
| Journal title / Source | 2024 IEEE International Symposium on Measurements & Networking proceedings |
| Publication date | 2024-8 |
| Conference name | 2024 IEEE International Symposium on Measurements & Networking |
| Conference date | 02-07-2024 to 05-07-2024 |
| Conference place | Rome, Italy |
| DOI | 10.5281/zenodo.13838741 |
| Language | English |