Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography
Chintala R.C., Wood S., Blakesley J.C., Favia P., Celano U., Paredis K., Vandervorst W., Castro F.A.conductive AFM, organic semiconductor, nanostructure, scanning probe tomography, nanowire
| Document type | Article |
| Journal title / Source | AIP Advances |
| Volume | 9 |
| Issue | 2 |
| Page numbers / Article number | 025105 |
| Publisher's name | AIP publishing |
| Publication date | 2011-2-19 |
| ISSN | 2158-3226 |
| DOI | 10.1063/1.5066458 |
| Web URL | https://aip.scitation.org/doi/full/10.1063/1.5066458 |
| Language | English |