Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

Chintala R.C., Wood S., Blakesley J.C., Favia P., Celano U., Paredis K., Vandervorst W., Castro F.A.

conductive AFM, organic semiconductor, nanostructure, scanning probe tomography, nanowire

Document type Article
Journal title / Source AIP Advances
Volume 9
Issue 2
Page numbers / Article number 025105
Publisher's name AIP publishing
Publication date 2011-2-19
ISSN 2158-3226
DOI 10.1063/1.5066458
Language English

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