Optical thin film metrology for optoelectronics
Petrik PP| Document type | Article |
| Journal title / Source | Journal of Physics : Conference series |
| Peer-reviewed article | 1 |
| Volume | 398 |
| Issue | 1 |
| Page numbers / Article number | 012002 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | London |
| Publication date | 2012 |
| ISSN | 1742-6588 |
| DOI | 10.1088/1742-6596/398/1/012002 |
| Web URL | http://iopscience.iop.org/article/10.1088/1742-6596/398/1/012002/pdf |
| Language | English |