Observing and measuring strain in nanostructures and devices with transmission electron microscopy
Hytch MH, Minor AMMNanostructure, silicon, stress/strain relationship, transmission electron microscopy
| Document type | Article |
| Journal title / Source | MRS Bulletin |
| Peer-reviewed article | 1 |
| Volume | 39 |
| Issue | 2 |
| Page numbers / Article number | 138-146 |
| Publisher's name | Cambridge University Press |
| Publisher's address (city only) | Cambridge |
| Publication date | 2014-2-12 |
| ISSN | 0883-7694 |
| DOI | 10.1557/mrs.2014.4 |
| Web URL | https://www.cambridge.org/core/journals/mrs-bulletin/article/observing-and-measuring-strain-in-nanostructures-and-devices-with-transmission-electron-microscopy/296C465E63EC9AEB189EFFE7AA4C1116 |
| Language | English |