Ultra-high precision CMMs as well as tactile and optical single scanning probes evaluation in dimensional metrology

Nouira H, Bergmans R H, Küng A., Piree H, Henselmans R., Spaan H.A.M.

measuring machine, chromatic confocal probe; tactile probe, error sources; dimensional and mechanical metrology, evaluation

Document type Article
Journal title / Source International Journal of Metrology and Quality Engineering
Publication date 2014
ISSN 2107-6839

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