Noncontact Atomic Force Microscopy Volume 3 Chapter 3: Simultaneous nc-AFM/STM Measurements with Atomic Resolution

Hapala P., Ondrácek M., Stetsovych O., Švec M., Jelínek P.
Keywords:

AFM/STM measurements

Document type Contribution to book
Journal title / Source
Book title Noncontact Atomic Force Microscopy
Volume 3
Page numbers / Article number 29-24
Publisher's name Springer International Publishing Switzerland
Publication date 2015
DOI 10.1007/978-3-319-15588-3_3
ISBN 978-3-319-15587-6
Language English

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