Near-field microwave excitation and detection of NEMS resonators
Hao L, Gallop J, Chen Jelectromechanical resonator, near-field microwave probe system
Document type | Proceedings |
Journal title / Source | 12th IEEE Conference on Nanotechnology (IEEE-NANO) |
Peer-reviewed article | 1 |
Volume | n/a |
Issue | n/a |
Page numbers / Article number | 1-5 |
Publisher's name | IEEE |
Publisher's address (city only) | New York |
Publication date | 2012-8-23 |
Conference name | 12th IEEE Conference on Nanotechnology |
Conference date | 20-08-2013 - 23-08-2012 |
Conference place | Birmingham |
ISSN | 1944-9399 |
DOI | 10.1109/NANO.2012.6321922 |
ISBN | 978-1-4673-2198-3 |
Web URL | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6321922 |
Language | English |