Near-field microwave excitation and detection of NEMS resonators

Hao L, Gallop J, Chen J
Keywords:

electromechanical resonator, near-field microwave probe system

Document type Proceedings
Journal title / Source 12th IEEE Conference on Nanotechnology (IEEE-NANO)
Peer-reviewed article 1
Volume n/a
Issue n/a
Page numbers / Article number 1-5
Publisher's name IEEE
Publisher's address (city only) New York
Publication date 2012-8-23
Conference name 12th IEEE Conference on Nanotechnology
Conference date 20-08-2013 - 23-08-2012
Conference place Birmingham
ISSN 1944-9399
DOI 10.1109/NANO.2012.6321922
ISBN 978-1-4673-2198-3
Web URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6321922
Language English

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