Nanoscale optical spectroscopy: an emerging tool for the characterization of graphene and related 2-D materials
Pollard A.J., Kumar N., Rae A., Mignuzzi S., Su W. (BEV), Roy D.Raman spectroscopy, tip-enhanced Raman spectroscopy (TERS), photoluminescence, defects, contamination, 2-D materials
| Document type | Article |
| Journal title / Source | journal of Materials NanoScience |
| Peer-reviewed article | 1 |
| Volume | 1 |
| Issue | 1 |
| Page numbers / Article number | 39-49 |
| Publisher's name | Intergrated Science |
| Publisher's address (city only) | New Delhi |
| Publication date | 2014-2-1 |
| ISSN | 2394-0867 |
| Web URL | http://www.pubs.iscience.in/journal/index.php/jmns/article/view/195 |
| Language | English |