"Multidimensional reflectometry for industry" (xD-Reflect) an European research project
Höpe A., Koo A., Verdu F.-M., Leloup F.-B., Obein G., Wübbeler G., Campos J., Iacomussi P., Jaanson P., Källberg S., Smids M.Reflectometry ; Metrology ; Modeling ; Optical design ; Optical testing ; Bidirectional reflectance transmission function ; CCD cameras ; Calibration ; Data analysis ; Light sources
| Document type | Proceedings |
| Journal title / Source | Proceedings of SPIE |
| Peer-reviewed article | 1 |
| Volume | 9018 |
| Page numbers / Article number | 901804 |
| Publisher's name | SPIE - The International Society for Optical Engineering |
| Publisher's address (city only) | Bellingham |
| Publication date | 2014-2-24 |
| Conference name | Measuring, Modeling, and Reproducing Material Appearance |
| Conference date | 4-5 February, 2014 |
| Conference place | San Francisco (USA) |
| ISSN | 0277-786X |
| DOI | 10.1117/12.2035981 |
| ISBN | 978-0-8194-9935-6 |
| Web URL | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1835520 |
| Language | English |