Real-Time Ellipsometry at High and Low Temperatures
Mukherjee D., Petrik P.In-situ ellipsometry, High temperature measurement, Low temperature measurement, Optical characterization
| Document type | Article |
| Journal title / Source | ACS Omega |
| Volume | 8 |
| Issue | 4 |
| Page numbers / Article number | 3684-3697 |
| Publisher's name | American Chemical Society (ACS) |
| Publisher's address (city only) | Washington, DC, United States |
| Publication date | 2023-1-17 |
| ISSN | 2470-1343, 2470-1343 |
| DOI | 10.1021/acsomega.2c07438 |
| Language | English |