Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry
Mukherjee D., Kalas B., Burger S., Safran G., Serenyi M., Fried M., Petrik P.Optical sensors, Plasmonics, Combinatorial material science, Spectroscopic Ellipsometry, Biosensing
| Document type | Article |
| Journal title / Source | Photonic Instrumentation Engineering X |
| Volume | 12428 |
| Issue | 12428 |
| Page numbers / Article number | 124280S |
| Publisher's name | SPIE |
| Publisher's address (city only) | Bellingham, WA, United States |
| Publication date | 2023-3 |
| Language | English |
| Persistent Identifier | https://doi.org/10.48550/arXiv.2303.14636 |