Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry
Mukherjee D., Kalas B., Burger S., Safran G., Serenyi M., Fried M., Petrik P.Optical sensors, Plasmonics, Combinatorial material science, Spectroscopic Ellipsometry, Biosensing
| Document type | Proceedings |
| Journal title / Source | Photonic Instrumentation Engineering X |
| Publisher's name | SPIE |
| Publisher's address (city only) | Bellingham, WA, United States |
| Publication date | 2023-3 |
| Conference name | Photonic Instrumentation Engineering X |
| Conference date | 07-03-2023 to 10-03-2023 |
| Conference place | San Francisco |
| Web URL | https://doi.org/10.48550/arXiv.2303.14636 |
| Language | English |
| Persistent Identifier | https://arxiv.org/pdf/2303.14636.pdf |