Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Mubarak F.A., Romano R., Galatro L., Mascolo V., Rietveld G., Spirito M.

extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer

Document type Article
Journal title / Source IEEE Transactions on Microwave Theory and Techniques
Volume 67
Issue 1
Page numbers / Article number 249-260
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2018-12
ISSN 0018-9480, 1557-9670
DOI 10.1109/TMTT.2018.2874667
Language English

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