Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Mubarak F.A., Romano R., Galatro L., Mascolo V., Rietveld G., Spirito M.
Keywords:

extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer

Document type Article
Journal title / Source IEEE Transactions on Microwave Theory and Techniques
Volume 67
Issue 1
Page numbers / Article number 249-260
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2018-12
ISSN 0018-9480, 1557-9670
DOI 10.1109/TMTT.2018.2874667
Web URL https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8566175
Language English

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