Noise Behavior and Implementation of Interferometer-Based Broadband VNA
Mubarak F.A., Romano R., Galatro L., Mascolo V., Rietveld G., Spirito M.extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 67 |
| Issue | 1 |
| Page numbers / Article number | 249-260 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication date | 2018-12 |
| ISSN | 0018-9480, 1557-9670 |
| DOI | 10.1109/TMTT.2018.2874667 |
| Web URL | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8566175 |
| Language | English |