An Interlaboratory Comparison of On-Wafer S-Parameter Measurements up to 1.1 THz
Mubarak F., Ridler N., Fisher G., Schmidt R., Stake J., Jayasankar D., Allal D., Doerner R., Flisgen T., Ducournau G., Haddadi K., Arz U., Phung G., Shang X.Calibration, coplanar waveguides (CPW), on-wafer, S-parameter measurements, comparison, Terahertz metrology
| Document type | Article |
| Journal title / Source | IEEE Transactions on Terahertz Science and Technology |
| Volume | 15 |
| Issue | 3 |
| Page numbers / Article number | 344-358 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2025-1-30 |
| ISSN | 2156-342X |
| DOI | 10.5281/zenodo.15395761 |
| Web URL | https://doi.org/10.5281/zenodo.15395761 |
| Language | English |