Automated Contacting of On-Wafer Devices for RF Testing

Mubarak F., Martino C.D., Toskovic R., Rietveld G., Spirito M.
Keywords:

On-wafer probing, on-wafer contacting, microwave measurements, measurement techniques, measurement uncertainty, precision measurements, uncertainty

Document type Proceedings
Journal title / Source 2020 Conference on Precision Electromagnetic Measurements (CPEM)
Volume N/A
Issue N/A
Page numbers / Article number 1-2
Publisher's name IEEE
Publication date 2020-9-10
Conference name 2020 Conference on Precision Electromagnetic Measurements (CPEM)
Conference date 24-08-2020 to 28-08-2020
Conference place Denver (Aurora), CO, USA, USA
ISSN 2160-0171
ISBN 978-1-7281-5899-0
Web URL https://zenodo.org/record/4276095
Language English
Persistent Identifier https://doi.org/10.1109/CPEM49742.2020.9191800

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