Model-based interfacing of large-scale metrology instruments
Montavon B., Peterek M., Schmitt R.H.Large-Scale Metrology, Internet of Production, Cyper Physical Production Systems
| Document type | Proceedings |
| Journal title / Source | Multimodal Sensing: Technologies and Applications |
| Publisher's name | SPIE |
| Publication date | 2019-6-21 |
| Conference name | SPIE Optical Metrology |
| Conference date | 24-06-2019 to 28-06-2019 |
| Conference place | Munich |
| DOI | 10.1117/12.2527461 |
| Web URL | http://arxiv.org/abs/2001.05897 |
| Language | English |