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Accurate and robust characterization of volume scattering materials using the intensity-based inverse adding-doubling method

Correia, A., Hanselaer, P. (KU Leuven) and Meuret, Y.
Keywords:

Volume scattering, solid-state lighting, inverse problem, adding-doubling

Document typeProceeding
Journal title / SourceSPIE Proceeding, Modeling Aspects in Optical Metrology VII
Volume11057
Issue-
Page numbers / Article number110570N
Publisher's nameSPIE
Publication date 2019-06-21
Conference nameModeling Aspects in Optical Metrology VII (SPIE Optical Metrology)
Conference date24-06-2019 to 26-06-2019
Conference placeMunich, Germany
ISSN0277-786X
DOI10.1117/12.2525791
ISBN9781510627932
Web URLhttps://lirias.kuleuven.be/2825988?limo=0
LanguageEnglish

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