Accurate and robust characterization of volume scattering materials using the intensity-based inverse adding-doubling method
Correia A., Hanselaer P., Meuret Y.Volume scattering, solid-state lighting, inverse problem, adding-doubling
| Document type | Proceedings |
| Journal title / Source | SPIE Proceeding, Modeling Aspects in Optical Metrology VII |
| Volume | 11057 |
| Issue | - |
| Page numbers / Article number | 110570N |
| Publisher's name | SPIE |
| Publication date | 2019-6-21 |
| Conference name | Modeling Aspects in Optical Metrology VII (SPIE Optical Metrology) |
| Conference date | 24-06-2019 to 26-06-2019 |
| Conference place | Munich, Germany |
| ISSN | 0277-786X |
| DOI | 10.1117/12.2525791 |
| ISBN | 9781510627932 |
| Web URL | https://lirias.kuleuven.be/2825988?limo=0 |
| Language | English |