Assessment of Subsampling Schemes for Compressive Nano-FTIR Imaging: Underlying Dataset
Metzner S., Kastner B., Marschall M., Wubbeler G., Wundrack S., Bakin A., Hoehl A., Ruhl E., Elster C.compressive nanoFTIR, NanoFourier transform infrared imaging, powerful scanning-based technique, nanometer spatial resolution, FTIR spectroscopy, scattering-type scanning near-field optical microscopy, spatial areas, sequential data acquisition, measurement times, mathematical techniques, randomly chosen measurements, random fashion, scanning procedures, different subsampling schemes, ensure rapid data acquisition, random subsampling, low-rank matrix reconstruction procedure, random reflection subsampling, nanoFTIR imaging, high spatial resolution
| Document type | Datasets |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 71 |
| Page numbers / Article number | 1-8 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| ISSN | 0018-9456, 1557-9662 |
| DOI | 10.5281/zenodo.7764081 |