Metrology to underpin future regulation of industrial emissions
Rausch Anne, Werhahn Olav, Witzel Oliver, Ebert Volker, Vuelban Edgar Moreno, Gersl Jan, Kvernmo Gjermund, Korsman John, Coleman Marc, Gardiner Tom, Robinson RodEMRP, industrial emissions
| Document type | Proceedings |
| Journal title / Source | International Congress of Metrology (CIM) 2015, Proceedings |
| Volume | 2015 |
| Issue | n.a. |
| Page numbers / Article number | 07008 |
| Publisher's name | EDP Sciences - Web of Conferences |
| Publisher's address (city only) | Les Ulis Cedex |
| Publication date | 2015-9-23 |
| Conference name | 17th International Comgress of Metrology 2015 |
| Conference date | 2015-09-21 to 2015-09-24 |
| Conference place | Paris |
| ISSN | n.a. |
| DOI | 10.1051/metrology/20150007008 |
| ISBN | n.a. |
| Web URL | http://cfmetrologie.edpsciences.org/articles/metrology/abs/2015/01/metrology_metr2015_07008/metrology_metr2015_07008.html |
| Language | English |