Metrological measurements in terahertz time-domain spectroscopy at LNE (from 100 GHz to 2 THz)
Charles M., Allal D., Allal DjamelRefractive index, Absorption coefficient, Terahertz, Spectrometry, Uncertainty, Thin layers, Metrology.
Document type | Proceedings |
Journal title / Source | Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on |
Peer-reviewed article | 1 |
Volume | 29 |
Issue | 1 |
Page numbers / Article number | 180 - 181 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway |
Publication date | 2014-8-24 |
Conference name | Conference on Precision Electromagnetic Measurements |
Conference date | 24-29/08/2014 |
Conference place | Rio de Janeiro, Brazil |
ISSN | 0589-1485 |
DOI | 10.1109/CPEM.2014.6898318 |
ISBN | 978-1-4799-5205-2 |
Web URL | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6898318 |
Language | English |