Metrological measurements in terahertz time-domain spectroscopy at LNE (from 100 GHz to 2 THz)

Charles M., Allal D., Allal Djamel
Keywords:

Refractive index, Absorption coefficient, Terahertz, Spectrometry, Uncertainty, Thin layers, Metrology.

Document type Proceedings
Journal title / Source Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Peer-reviewed article 1
Volume 29
Issue 1
Page numbers / Article number 180 - 181
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2014-8-24
Conference name Conference on Precision Electromagnetic Measurements
Conference date 24-29/08/2014
Conference place Rio de Janeiro, Brazil
ISSN 0589-1485
DOI 10.1109/CPEM.2014.6898318
ISBN 978-1-4799-5205-2
Web URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6898318
Language English

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