Methods for determining piezoelectric properties of thin epitaxial films: Theoretical foundations
McCartney LNM, Wright LW, Cain MGC, Crain JC, Martyna GJM, Newns DMNPiezoelectric films, Elasticity,Electrodes, Electric measurements, Piezoelectric fields
Document type | Article |
Journal title / Source | Journal Applied Physics |
Peer-reviewed article | 1 |
Volume | 116 |
Page numbers / Article number | 14104 |
Publisher's name | American Institute of Physics (AIP) |
Publication date | 2014 |
ISSN | 0021-8979 |
DOI | 10.1063/1.4885058 |
Web URL | http://scitation.aip.org/content/aip/journal/jap/116/1/10.1063/1.4885058 |
Language | English |