Support for standardisation of high voltage testing with composite and combined wave shapes
Meisner J., Gockenbach E., Saadeddine H., Havunen J., Schichler U., Elg A-P., Garnacho F., Roccato P.E., Merev A., Lahti K., Backhaus K., Orrea A., Gamlin M., Steiner T.Electricity grids, high voltage testing, traceability, combined wave shapes, composite wave shapes, universal dividers, calibration
Document type | Proceedings |
Journal title / Source | VDE High Voltage Technology 2020, ETG-Symposium |
Publisher's name | VDE |
Publication date | 2020-11-11 |
Conference name | VDE High Voltage Technology 2020 |
Conference date | 09-11-2020 to 11-11-2020 |
Conference place | online |
Web URL | https://oar.ptb.de/resources/show/10.7795/EMPIR.19NRM07.CA.20210215 |
Language | English |
Persistent Identifier | https://oar.ptb.de/resources/show/10.7795/EMPIR.19NRM07.CA.20210215 |