Support for standardisation of high voltage testing with composite and combined wave shapes
Meisner J., Gockenbach E., Saadeddine H., Havunen J., Schichler U., Elg A-P., Garnacho F., Roccato P.E., Merev A., Lahti K., Backhaus K., Orrea A., Gamlin M., Steiner T.Electricity grids, high voltage testing, traceability, combined wave shapes, composite wave shapes, universal dividers, calibration
| Document type | Proceedings |
| Journal title / Source | VDE High Voltage Technology 2020, ETG-Symposium |
| Publisher's name | VDE |
| Publication date | 2020-11-11 |
| Conference name | VDE High Voltage Technology 2020 |
| Conference date | 09-11-2020 to 11-11-2020 |
| Conference place | online |
| Web URL | https://oar.ptb.de/resources/show/10.7795/EMPIR.19NRM07.CA.20210215 |
| Language | English |
| Persistent Identifier | https://oar.ptb.de/resources/show/10.7795/EMPIR.19NRM07.CA.20210215 |