Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast
Dong Hyun Kim, Sung-Jo Kim, Jeong-Seon Yu, Jong-Hyun KimThickness, Optical contrast, h-BN, Microscope, Optical inspection, Surface measurements, Thin films, figure, optical properties
Document type | Article |
Journal title / Source | Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast |
Volume | 19 |
Issue | 5 |
Page numbers / Article number | 503-507 |
Publisher's name | Journal of the Optical Society of Korea |
Publication date | 2015-10 |
DOI | 10.3807/JOSK.2015.19.5.503 |
Web URL | http://www.osapublishing.org/abstract.cfm?uri=josk-19-5-503 |
Language | English |