Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast

Dong Hyun Kim, Sung-Jo Kim, Jeong-Seon Yu, Jong-Hyun Kim
Keywords:

Thickness, Optical contrast, h-BN, Microscope, Optical inspection, Surface measurements, Thin films, figure, optical properties

Document type Article
Journal title / Source Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast
Volume 19
Issue 5
Page numbers / Article number 503-507
Publisher's name Journal of the Optical Society of Korea
Publication date 2015-10
DOI 10.3807/JOSK.2015.19.5.503
Web URL http://www.osapublishing.org/abstract.cfm?uri=josk-19-5-503
Language English

Back to the list view