NPL freeform artefact for verification of non-contact measuring systems
McCarthy M., Brown S., Evenden A., Robinson A.| Document type | Proceedings |
| Journal title / Source | SPIE Proceedings of 23rd Annual Symposium of Electronic Imaging |
| Volume | 7864 |
| Issue | 78640K |
| Publication date | 2011-2 |
| Conference name | SPIE 23rd Annual Symposium of Electronic Imaging |
| Conference date | 23 - 27 January 2011 |
| Conference place | San Francisco, CA, USA |
| Web URL | http://spiedigitallibrary.org/proceedings/resource/2/psisdg/7864/1/78640K_1?isAuthorized=no |