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Maximizing the Benefit of Existing Equipment for Nonlinear and Communication Measurements

Humphreys D. A., Raffo A., Bosi G., Vannini G., Schreurs D., Gebremicael K. N., Morris K.
Keywords:

Nonlinear measurements, oscilloscope, sampling, analogue to digital conversion

Document type Proceedings
Journal title / Source N/A
Peer-reviewed article 1
Volume N/A
Issue N/A
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2016-5-27
Conference name 87th ARFTG Microwave Measurement Conference
Conference date 27-05-2016
Conference place San Francisco, CA, USA
ISSN N/A
ISBN 978-1-5090-1308-1
Web URL http://www.arftg.org/
Language English
Persistent Identifier IEEE Catalog Number: CFP16ARF-ART

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 Metrology for Industry (II)