The gateway to Europe's
integrated metrology community.

Maximizing the Benefit of Existing Equipment for Nonlinear and Communication Measurements

Humphreys D. A., Raffo A., Bosi G., Vannini G., Schreurs D., Gebremicael K. N., Morris K.

Nonlinear measurements, oscilloscope, sampling, analogue to digital conversion

Document type Proceedings
Journal title / Source N/A
Peer-reviewed article 1
Volume N/A
Issue N/A
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2016-5-27
Conference name 87th ARFTG Microwave Measurement Conference
Conference date 27-05-2016
Conference place San Francisco, CA, USA
ISBN 978-1-5090-1308-1
Language English
Persistent Identifier IEEE Catalog Number: CFP16ARF-ART

Back to the list view


Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 Metrology for Industry (II)