Calibration of a silicon crystal for absolute nuclear spectroscopy
Massa Enrico, Mana Giovanni, Kuetgens Ulrich, Ferroglio LucaX-ray optics; X-ray interferometry; instrumentation; measurement and metrology, interferometry
| Document type | Article |
| Journal title / Source | Journal of Applied Crystallography |
| Volume | 43 |
| Page numbers / Article number | 5 pages |
| Publication date | 2010-1-13 |
| ISSN | 0021-8898 |