Calibration of a silicon crystal for absolute nuclear spectroscopy

Massa Enrico, Mana Giovanni, Kuetgens Ulrich, Ferroglio Luca

X-ray optics; X-ray interferometry; instrumentation; measurement and metrology, interferometry

Document type Article
Journal title / Source Journal of Applied Crystallography
Volume 43
Page numbers / Article number 5 pages
Publication date 2010-1-13
ISSN 0021-8898

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