Measurement of the lattice parameter of a silicon crystal

Massa E., Mana G., Kuetgens U., Ferroglio L.

X-ray optics; X-ray interferometry; instrumentation, measurement and metrology; interferometry.

Document type Article
Journal title / Source New Journal of Physics
Volume 11
Issue 053013
Page numbers / Article number 12 pages
Publication date 2009-5-27

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