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Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer

Marti, K. (METAS, Bern-Wabern, Switzerland), Unger, W.E.S., Gross, T., Krumrey, M., Kalbe, H., Treu, D. and Dietrich, P.M.
Keywords:

XPS, electron effective attenuation length, Pd 3d

Document typeArticle
Journal title / SourceSurface and Interface Analysis
Volume49
Issue5
Page numbers / Article number464-468
Publisher's nameWiley
Publication date 2016-09-15
ISSN0142-2421
DOI10.1002/sia.6141
Web URLhttps://onlinelibrary.wiley.com/doi/abs/10.1002/sia.6141
LanguageEnglish

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