Uncertainty Budget in Microwave High-Power Testing
Rodriguez M., Montero I., García-Patrón M., Ruiz-Cruz J.AUncertainty Budget, Microwave, High-Power Testing
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 72 |
| Page numbers / Article number | 1-12 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2023 |
| ISSN | 0018-9456, 1557-9662 |
| DOI | 10.1109/TIM.2023.3317909 |
| Web URL | https://ieeexplore.ieee.org/document/10261456 |
| Language | English |