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Dual-sweep frequency scanning interferometry using four wave mixing

Martinez Juan, Campbell Michael, Warden Matthew, Hughes Ben, Copner Nigel, Lewis Andrew
Keywords:

distance measurements, sweep laser applications, four wave mixing, FSI

Document type Article
Journal title / Source IEEE Photonics Technology Letters
Volume 27
Issue 7
Page numbers / Article number 733-736
Publication date 2015-4
DOI 10.1109/LPT.2015.2390779
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7014240

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Information

Project title (JRP)
IND53: Large Volume: Large volume metrology in industry
Name of Call / Funding Programme
EMRP A169: Call 2012 Metrology for Industry (II)