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Dual-sweep frequency scanning interferometry using four wave mixing

Martinez Juan, Campbell Michael, Warden Matthew, Hughes Ben, Copner Nigel, Lewis Andrew

distance measurements, sweep laser applications, four wave mixing, FSI

Document type Article
Journal title / Source IEEE Photonics Technology Letters
Volume 27
Issue 7
Page numbers / Article number 733-736
Publication date 2015-4
DOI 10.1109/LPT.2015.2390779

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Project title (JRP)
IND53: Large Volume: Large volume metrology in industry
Name of Call / Funding Programme
EMRP A169: Call 2012 Metrology for Industry (II)