The concept of metrological validation of active measurement sensors - CENAGIS-MET
Markiewicz J., Łapiński S., Macek A., Wiśniewski M.CENAGIS-MET, VDI/VDE, range-based method, metrology, quality evaluation
| Document type | Proceedings |
| Journal title / Source | The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences |
| Volume | XLIX-B1-20 |
| Page numbers / Article number | 299-306 |
| Publisher's name | Copernicus GmbH |
| Publisher's address (city only) | Gottingen, Germany |
| Publication date | 2026-1-1 |
| Conference name | XXV ISPRS Congress 2026 “From Imagery to Understanding” |
| Conference date | 4–11 July, 2026 |
| Conference place | Toronto, Canada |
| ISSN | 2194-9034 |
| DOI | 10.5194/isprs-archives-XLIX-B1-2026-299-2026 |