Methods for characterization and minimization of microwave background in cryogenic environment
Manninen A., Kemppinen A., Mykkänen E., Lehtinen J. S.Cryogenics, microwave filters, metrology, single electron transistors
Document type | Proceedings |
Journal title / Source | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
Publisher's name | IEEE |
Publication date | 2016-7 |
Conference name | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
Conference date | 10-07-2016 to 15-07-2016 |
Conference place | Ottawa, Canada |
DOI | 10.1109/CPEM.2016.7540789 |
Language | English |