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Methods for characterization and minimization of microwave background in cryogenic environment

Manninen A., Kemppinen A., Mykkänen E., Lehtinen J. S.
Keywords:

Cryogenics, microwave filters, metrology, single electron transistors

Document type Proceedings
Journal title / Source 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Publisher's name IEEE
Publication date 2016-7
Conference name 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Conference date 10-07-2016 to 15-07-2016
Conference place Ottawa, Canada
DOI 10.1109/CPEM.2016.7540789
Language English

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Information

Project title (JRP)
EXL03: MICROPHOTON: Measurement and control of single-photon microwave radiation on a chip
Name of Call / Funding Programme
EMRP A169: Call 2012 Open excellence call