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A More Accurate Measurement of the28Si Lattice Parameter

Mana, G., Sasso, C. P., Massa, E. and Mana, Giovanni
Keywords:

Error analysis, Optical interferometers,Temperature measurement, Laser beams. Lattice constants. X-ray diffraction. X-ray interferometry. interferometers, Electric measurements

Document typeArticle
Journal title / SourceJournal of Physical and Chemical Reference Data
Volume44
Issue3
Page numbers / Article number031208
Publisher's nameAIP Publishing
Publication date 2015-09
ISSN0047-2689, 1529-7845
DOI10.1063/1.4917488
LanguageEnglish

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