A More Accurate Measurement of the28Si Lattice Parameter
Mana G., Sasso C. P., Massa E., Mana GiovanniError analysis, Optical interferometers,Temperature measurement, Laser beams. Lattice constants. X-ray diffraction. X-ray interferometry. interferometers, Electric measurements
| Document type | Article |
| Journal title / Source | Journal of Physical and Chemical Reference Data |
| Volume | 44 |
| Issue | 3 |
| Page numbers / Article number | 031208 |
| Publisher's name | AIP Publishing |
| Publication date | 2015-9 |
| ISSN | 0047-2689, 1529-7845 |
| DOI | 10.1063/1.4917488 |
| Language | English |