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Phase topography-based characterization of thermal effects on materials and joining techniques

Lorenz, Hagen, Beckert, Erik and Schödel, René
Keywords:

Interferometric imaging; Rotation-invariant pattern recognition; Fringe analysis; Height measurements; Interferometry; Metrological instrumentation; Optomechanics;Thermal effects

Document typeArticle
Journal title / SourceApplied Optics / Vol 54, No 8 / 10 March 2015
Volume54
Issue8
Page numbers / Article number2046-2056
Publication date 2015-03-6
DOI10.1364/AO.54.002046
Web URLhttp://www.opticsinfobase.org/ao/abstract.cfm?uri=ao-54-8-2046

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