Phase topography-based characterization of thermal effects on materials and joining techniques
Lorenz Hagen, Beckert Erik, Schödel RenéInterferometric imaging; Rotation-invariant pattern recognition; Fringe analysis; Height measurements; Interferometry; Metrological instrumentation; Optomechanics;Thermal effects
| Document type | Article |
| Journal title / Source | Applied Optics / Vol 54, No 8 / 10 March 2015 |
| Volume | 54 |
| Issue | 8 |
| Page numbers / Article number | 2046-2056 |
| Publication date | 2015-3-6 |
| DOI | 10.1364/AO.54.002046 |
| Web URL | http://www.opticsinfobase.org/ao/abstract.cfm?uri=ao-54-8-2046 |