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Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing

Liu, J., Happonen, T., Su, R., Feng, X. (Max Planck Institute for Polymer Research, Germany) and Barlow, C.
Keywords:

all-optical difference engine, defects, detection, printed electronics, roll-to-roll, Fourier optics and signal processing, Spatial filtering, Imaging systems, Optical inspection, Optical sensing and sensors

Document typeArticle
Journal title / SourceOptics Express
Volume26
Issue11
Page numbers / Article number13927
Publisher's nameThe Optical Society
Publication date 2018-05-16
ISSN1094-4087
DOI10.1364/OE.26.013927
Web URLhttps://www.osapublishing.org/oe/abstract.cfm?uri=oe-26-11-13927
LanguageEnglish

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