Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices
Votsi H., Roch-Jeune I., Haddadi K., Li C., Dambrine G., Aaen P.H., Ridler N.Standards, Calibration, Impedance, Nanoscale devices, Impedance measurement, Probes, Transmission line measurements, extreme impedance measurement, Calibration, on-wafer measurement, nano-scale, co-planar waveguide, RF nanotechnology
Document type | Proceedings |
Journal title / Source | IEEE XPlore |
Publisher's name | IEEE |
Publisher's address (city only) | USA & Canada |
Publication date | 2016 |
Conference name | Microwave Measurement Conference (ARFTG) |
Conference date | 08-12-2016 to 09-12-2016 |
Conference place | Austin, TX, USA |
DOI | 10.1109/ARFTG.2016.7839719 |
Web URL | http://epubs.surrey.ac.uk/813783/1/Votsi_88th_ARFTG_Paper_Summary%20%28002%29.pdf |
Language | English |